Deskripsi :

The JEM-2100Plus JEOL can be used for analyzing Transmission Electron Miscroscopy (TEM) Low Resolution (LR-TEM) and High Resolution (HR-TEM), analysis Scanning Transmission Electron Microscopy (STEM), and analysis TEM-Energy Dispersive X-Ray Spectroscopy (TEM-EDS), including Kit Sample Preparation Tools for electron microscope of wide range applications from Advanced Materials, Membrane (surface dan/atau cross section), and Thin Film (surface dan/atau cross section) studies, as well as other materials, excluding biology samples. CATATAN: Harga sudah termasuk "Biaya Preparasi Sampel TEM". PERSYARATAN SAMPEL UJI: (1) Thin Film (ketebalan kaca substrat maksimum 0,5 cm). (2). Advanced Materials (jika lempeng logam, ketebalan maksimum 0,5 cm; jika serbuk/powder minimum berat total 0,5 gram; jika cairan minimum volume total 15 mL jenis pelarut ditentukan sendiri oleh Pelanggan atau diskusi dulu dengan Teknisi/Analis).

Parameter uji :

Parameter	Tarif (Rp.)
Low Resolution Transmission Electron Microscope (LR-TEM)	1.800.000
High Resolution Transmission Electron Microscope (HR-TEM)	3.000.000
Low Resolution Transmission Electron Microscope (LR-TEM) + Scanning Transmission Electron Microscopy (STEM)	2.000.000
Electron Tomography (ET) - High Resolution Transmission Electron Microscope (HR-TEM)	3.250.000
+ Electron Diffraction - TEM	200.000
+ Energy Dispersive X-Ray Spectroscopy (TEM-EDS)	200.000